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Editorial Board

Editors-in-Chief

 

Khan Akhtar A. Khan
Rochester Institute of Technology, USA
[email protected]
Qin Xiaolong Qin
Hangzhou Normal University, China
[email protected]
Yao Jen-Chih Yao
National Sun Yat-sen University, Taiwan
[email protected]

 

Editors

 

Samir Adly, Université de Limoges, France
[email protected]

 

Nasir U. Ahmed, University of Ottawa, Canada
[email protected]

 

Jose Yunier Bello-Cruz, Northern Illinois University, USA
[email protected]

 

Patrizia Daniele, University of Catania, Italy
[email protected]

 

Nguyen Dinh, International University, VNU-HCM, Vietnam
[email protected]

 

Franco Giannessi, University of Pisa, Italy
[email protected]

 

Aviv Gibali, ORT Braude College, Israel
[email protected]

 

Joachim Gwinner, Universitat der Bundeswehr Munchen, Germany
[email protected]

 

Tim Hoheisel, McGill University, Canada
[email protected]

 

Yaohua Hu, Shenzhen University, China
[email protected]

 
Basca Jadamba, Rochester Institute of Technology, USA
[email protected]

 

Phan Quoc Khanh, International University, VNU-HCM, Vietnam
[email protected]

 

Jingwei Liang, Shanghai Jiao Tong University, China
[email protected]

 

Yves Lucet, The University of British Columbia, Canada
[email protected]

 

Juan Enrique Martínez-Legaz, Universitat Autònoma de Barcelona, Spain
[email protected]

 

Stanislaw Migorski, Jagiellonian University in Krakow, Poland
[email protected]

 

Boris S. Mordukhovich, Wayne State University, USA
[email protected]

 

Abdullatif Moudafi, Aix Marseille Universite, France
[email protected]

 

Mau Nam Nguyen, Portland State University, USA
[email protected]

 

D.R. Sahu, Banaras Hindu University, India
[email protected]

 

Hari M. Srivastava, University of Victoria, Canada
[email protected]

 

Fabio Raciti, University of Catania, Italy
[email protected]

 

Elena Resmerita, Alpen-Adria University of Klagenfurt, Austria
[email protected]

 

Miguel Sama, Universidad Nacional de Educación a Distancia, Spain
[email protected]

 

Christiane Tammer, Martin Luther University of Halle-Wittenberg, Germany
[email protected]

 

Phan Tu Vuong, University of Southampton, UK
[email protected]

 

Shiping Wang, Fuzhou University, China
[email protected]

 

Alexander Zaslavski, The Technion-Israel Institute of Technology, Israel
[email protected]

 

William Zhu, University of Electronic Science and Technology of China, China
[email protected]